Modeling Nanoscale Imaging in Electron Microscopy (Record no. 101227)

000 -LEADER
fixed length control field 03714nam a22005295i 4500
001 - CONTROL NUMBER
control field 978-1-4614-2191-7
003 - CONTROL NUMBER IDENTIFIER
control field DE-He213
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20140220083245.0
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr nn 008mamaa
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 120301s2012 xxu| s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9781461421917
-- 978-1-4614-2191-7
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1007/978-1-4614-2191-7
Source of number or code doi
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number TA404.6
072 #7 - SUBJECT CATEGORY CODE
Subject category code TGMT
Source bicssc
072 #7 - SUBJECT CATEGORY CODE
Subject category code TEC021000
Source bisacsh
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 620.11
Edition number 23
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Vogt, Thomas.
Relator term editor.
245 10 - TITLE STATEMENT
Title Modeling Nanoscale Imaging in Electron Microscopy
Medium [electronic resource] /
Statement of responsibility, etc edited by Thomas Vogt, Wolfgang Dahmen, Peter Binev.
264 #1 -
-- Boston, MA :
-- Springer US,
-- 2012.
300 ## - PHYSICAL DESCRIPTION
Extent XV, 265p. 80 illus., 32 illus. in color.
Other physical details online resource.
336 ## -
-- text
-- txt
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-- computer
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-- rdamedia
338 ## -
-- online resource
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347 ## -
-- text file
-- PDF
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490 1# - SERIES STATEMENT
Series statement Nanostructure Science and Technology,
International Standard Serial Number 1571-5744
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note Statistical and Information-Theoretic Analysis of Resolution in Imaging -- (Scanning) Transmission Electron Microscopy: Overview and Examples for the Non-Microscopist -- Seeing Atoms in the Crossroads of Microscopy and Mathematics -- Kantianism at the Nanoscale -- Reference free cryo-EM algorithms using self-consistent data fusion -- Reference free cryo-EM algorithms using self-consistent data fusion -- Applications of multivariate statistical analysis for large-scale spectrum-image datasets and atomic-resolution images -- Compressed Sensing -- Imaging the behavior of atoms, clusters and nanoparticles during elevated temperature experiments in an aberration-corrected electron microscope -- Towards Quantitative Imaging using Aberration Correction and Exit Wave Reconstruction -- Image registration, classification and averaging in cryo-electron tomography -- (Scanning) Transmission Electron Microscopy with High spatial, temporal and energy resolution -- Fluctuation Microscopy: Nanoscale Order in Amorphous Materials from Electron Nanodiffraction -- Information in super-resolution microscopy and automated analysis of large-scale calcium imaging data -- Concluding remarks on Imaging in Electron Microscopy.
520 ## - SUMMARY, ETC.
Summary, etc Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Analytical biochemistry.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Chemistry.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Nanotechnology.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Surfaces (Physics).
650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Materials Science.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Characterization and Evaluation of Materials.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Analytical Chemistry.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Nanotechnology.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Theoretical and Computational Chemistry.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Measurement Science and Instrumentation.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Dahmen, Wolfgang.
Relator term editor.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Binev, Peter.
Relator term editor.
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element SpringerLink (Online service)
773 0# - HOST ITEM ENTRY
Title Springer eBooks
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Display text Printed edition:
International Standard Book Number 9781461421900
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE
Uniform title Nanostructure Science and Technology,
-- 1571-5744
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier http://dx.doi.org/10.1007/978-1-4614-2191-7
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