Managing Temperature Effects in Nanoscale Adaptive Systems (Record no. 100918)

000 -LEADER
fixed length control field 03443nam a22004575i 4500
001 - CONTROL NUMBER
control field 978-1-4614-0748-5
003 - CONTROL NUMBER IDENTIFIER
control field DE-He213
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20140220083240.0
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr nn 008mamaa
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 110829s2012 xxu| s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9781461407485
-- 978-1-4614-0748-5
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1007/978-1-4614-0748-5
Source of number or code doi
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number TK7888.4
072 #7 - SUBJECT CATEGORY CODE
Subject category code TJFC
Source bicssc
072 #7 - SUBJECT CATEGORY CODE
Subject category code TEC008010
Source bisacsh
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.3815
Edition number 23
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Wolpert, David.
Relator term author.
245 10 - TITLE STATEMENT
Title Managing Temperature Effects in Nanoscale Adaptive Systems
Medium [electronic resource] /
Statement of responsibility, etc by David Wolpert, Paul Ampadu.
264 #1 -
-- New York, NY :
-- Springer New York :
-- Imprint: Springer,
-- 2012.
300 ## - PHYSICAL DESCRIPTION
Extent XXII, 174p. 108 illus.
Other physical details online resource.
336 ## -
-- text
-- txt
-- rdacontent
337 ## -
-- computer
-- c
-- rdamedia
338 ## -
-- online resource
-- cr
-- rdacarrier
347 ## -
-- text file
-- PDF
-- rda
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note The Role of Temperature in Electronic Design -- Temperature Effects in Semiconductors -- Sensing Temperature Dependence -- Variation-Tolerant Adaptive Voltage Systems -- Controlling the Temperature Dependence -- Exploiting Temperature Dependence in Low-Swing Interconnect Links -- Avoiding Temperature-Induced Errors in On-Chip Interconnects -- Future Work and Open Problems.
520 ## - SUMMARY, ETC.
Summary, etc This book discusses new techniques for detecting, controlling, and exploiting the impacts of temperature variations on nanoscale circuits and systems.  It provides a holistic discussion of temperature management, including physical phenomena (reversal of the MOSFET temperature dependence) that have recently become problematic, along with circuit techniques for detecting, controlling, and adapting to these phenomena. A detailed discussion is also included of the general aspects of thermal-aware system design and management of temperature-induced faults. A new sensor system is described that can determine the temperature dependence as well as the operating temperature to improve system reliability.  A new method is presented to control a circuit’s temperature dependence by individually tuning pull-up and pull-down networks to their temperature-insensitive operating points. This method extends the range of supply voltages that can be made temperature-insensitive, achieving insensitivity at nominal voltage for the first time. Provides background on aspects of nanoscale circuits and systems that are affected by temperature, how they are affected by temperature, and what systems can be used to reduce these effects; Describes chip implementation details of a new type of temperature sensor that can ensure reliable operation across multiple temperature dependences; Includes new methods for achieving temperature insensitivity with example circuits and fabrication-related details such as process variation management.              
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Engineering.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Electronics.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Systems engineering.
650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Engineering.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Circuits and Systems.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Electronics and Microelectronics, Instrumentation.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Nanotechnology and Microengineering.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Ampadu, Paul.
Relator term author.
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element SpringerLink (Online service)
773 0# - HOST ITEM ENTRY
Title Springer eBooks
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Display text Printed edition:
International Standard Book Number 9781461407478
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier http://dx.doi.org/10.1007/978-1-4614-0748-5
912 ## -
-- ZDB-2-ENG

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