Built-in-Self-Test and Digital Self-Calibration for RF SoCs (Record no. 100584)

000 -LEADER
fixed length control field 02382nam a22004695i 4500
001 - CONTROL NUMBER
control field 978-1-4419-9548-3
003 - CONTROL NUMBER IDENTIFIER
control field DE-He213
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20140220083234.0
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr nn 008mamaa
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 110922s2012 xxu| s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9781441995483
-- 978-1-4419-9548-3
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1007/978-1-4419-9548-3
Source of number or code doi
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number TK7888.4
072 #7 - SUBJECT CATEGORY CODE
Subject category code TJFC
Source bicssc
072 #7 - SUBJECT CATEGORY CODE
Subject category code TEC008010
Source bisacsh
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.3815
Edition number 23
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Bou-Sleiman, Sleiman.
Relator term author.
245 10 - TITLE STATEMENT
Title Built-in-Self-Test and Digital Self-Calibration for RF SoCs
Medium [electronic resource] /
Statement of responsibility, etc by Sleiman Bou-Sleiman, Mohammed Ismail.
264 #1 -
-- New York, NY :
-- Springer New York,
-- 2012.
300 ## - PHYSICAL DESCRIPTION
Extent XVII, 89p. 70 illus.
Other physical details online resource.
336 ## -
-- text
-- txt
-- rdacontent
337 ## -
-- computer
-- c
-- rdamedia
338 ## -
-- online resource
-- cr
-- rdacarrier
347 ## -
-- text file
-- PDF
-- rda
490 1# - SERIES STATEMENT
Series statement SpringerBriefs in Electrical and Computer Engineering
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note Introduction and Motivation -- Radio Systems Overview: Architecture, Performance and Built-in-Test -- Efficient Testing for RF SoCs -- RF Built-in-Self-Test -- RF Built-in-Self-Calibration -- Conclusions.
520 ## - SUMMARY, ETC.
Summary, etc This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume. 
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Engineering.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Systems engineering.
650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Engineering.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Circuits and Systems.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Signal, Image and Speech Processing.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Electronic Circuits and Devices.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Ismail, Mohammed.
Relator term author.
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element SpringerLink (Online service)
773 0# - HOST ITEM ENTRY
Title Springer eBooks
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Display text Printed edition:
International Standard Book Number 9781441995476
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE
Uniform title SpringerBriefs in Electrical and Computer Engineering
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier http://dx.doi.org/10.1007/978-1-4419-9548-3
912 ## -
-- ZDB-2-ENG

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