Wang, Patrick S. P.

Pattern Recognition, Machine Intelligence and Biometrics [electronic resource] / edited by Patrick S. P. Wang. - Berlin, Heidelberg : Springer Berlin Heidelberg, 2011. - digital.

9783642224072

10.1007/978-3-642-22407-2 doi


Computer science.
Artificial intelligence.
Optical pattern recognition.
Biometrics.
Computer Science.
Pattern Recognition.
Biometrics.
Signal, Image and Speech Processing.
Artificial Intelligence (incl. Robotics).

Q337.5 TK7882.P3

006.4

2017 | The Technical University of Kenya Library | +254(020) 2219929, 3341639, 3343672 | library@tukenya.ac.ke | Haile Selassie Avenue