Leach, Richard.
Optical Measurement of Surface Topography [electronic resource] / edited by Richard Leach. - Berlin, Heidelberg : Springer Berlin Heidelberg, 2011. - digital.
9783642120121
10.1007/978-3-642-12012-1 doi
Microwaves.
Surfaces (Physics).
Materials Science.
Characterization and Evaluation of Materials.
Microwaves, RF and Optical Engineering.
Measurement Science and Instrumentation.
Surfaces and Interfaces, Thin Films.
TA404.6
620.11
Optical Measurement of Surface Topography [electronic resource] / edited by Richard Leach. - Berlin, Heidelberg : Springer Berlin Heidelberg, 2011. - digital.
9783642120121
10.1007/978-3-642-12012-1 doi
Microwaves.
Surfaces (Physics).
Materials Science.
Characterization and Evaluation of Materials.
Microwaves, RF and Optical Engineering.
Measurement Science and Instrumentation.
Surfaces and Interfaces, Thin Films.
TA404.6
620.11