Rein, Stefan.
Lifetime Spectroscopy A Method of Defect Characterization in Silicon for Photovoltaic Applications / [electronic resource] : by Stefan Rein. - Berlin, Heidelberg : Springer Berlin Heidelberg, 2005. - digital. - Springer Series in Material Science, 85 0933-033X ; . - Springer Series in Material Science, 85 .
9783540279228
10.1007/3-540-27922-9 doi
Physics.
Particles (Nuclear physics).
Optical materials.
Physics.
Solid State Physics and Spectroscopy.
Optical and Electronic Materials.
QC176-176.9
530.41
Lifetime Spectroscopy A Method of Defect Characterization in Silicon for Photovoltaic Applications / [electronic resource] : by Stefan Rein. - Berlin, Heidelberg : Springer Berlin Heidelberg, 2005. - digital. - Springer Series in Material Science, 85 0933-033X ; . - Springer Series in Material Science, 85 .
9783540279228
10.1007/3-540-27922-9 doi
Physics.
Particles (Nuclear physics).
Optical materials.
Physics.
Solid State Physics and Spectroscopy.
Optical and Electronic Materials.
QC176-176.9
530.41