Kirkland, Earl J.

Advanced Computing in Electron Microscopy [electronic resource] / by Earl J. Kirkland. - Boston, MA : Springer US, 2010. - digital.

9781441965332

10.1007/978-1-4419-6533-2 doi


Computer engineering.
Surfaces (Physics).
Materials Science.
Characterization and Evaluation of Materials.
Electrical Engineering.

TA404.6

620.11

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