Pavlov, Andrei.
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test / [electronic resource] : by Andrei Pavlov, Manoj Sachdev. - Dordrecht : Springer Netherlands, 2008. - digital. - Frontiers In Electronic Testing, 40 0929-1296 ; . - Frontiers In Electronic Testing, 40 .
9781402083631
10.1007/978-1-4020-8363-1 doi
Engineering.
Memory management (Computer science).
Systems engineering.
Engineering.
Circuits and Systems.
Memory Structures.
TK7888.4
621.3815
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test / [electronic resource] : by Andrei Pavlov, Manoj Sachdev. - Dordrecht : Springer Netherlands, 2008. - digital. - Frontiers In Electronic Testing, 40 0929-1296 ; . - Frontiers In Electronic Testing, 40 .
9781402083631
10.1007/978-1-4020-8363-1 doi
Engineering.
Memory management (Computer science).
Systems engineering.
Engineering.
Circuits and Systems.
Memory Structures.
TK7888.4
621.3815