Tan, Cher Ming.
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections [electronic resource] / by Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou. - 1. - London : Springer London, 2011. - digital. - Springer Series in Reliability Engineering, 1614-7839 . - Springer Series in Reliability Engineering, .
9780857293107
10.1007/978-0-85729-310-7 doi
Engineering.
Differential equations, partial.
System safety.
Electronics.
Optical materials.
Engineering.
Quality Control, Reliability, Safety and Risk.
Computational Intelligence.
Electronics and Microelectronics, Instrumentation.
Optical and Electronic Materials.
Partial Differential Equations.
TA169.7 T55-T55.3 TA403.6
658.56
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections [electronic resource] / by Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou. - 1. - London : Springer London, 2011. - digital. - Springer Series in Reliability Engineering, 1614-7839 . - Springer Series in Reliability Engineering, .
9780857293107
10.1007/978-0-85729-310-7 doi
Engineering.
Differential equations, partial.
System safety.
Electronics.
Optical materials.
Engineering.
Quality Control, Reliability, Safety and Risk.
Computational Intelligence.
Electronics and Microelectronics, Instrumentation.
Optical and Electronic Materials.
Partial Differential Equations.
TA169.7 T55-T55.3 TA403.6
658.56