Huisman, Leendert M.
Data Mining and Diagnosing IC Fails [electronic resource] / by Leendert M. Huisman. - Boston, MA : Springer US, 2005. - digital. - Frontiers in Electronic Testing, 31 0929-1296 ; . - Frontiers in Electronic Testing, 31 .
9780387263519
10.1007/b137446 doi
Engineering.
Electronics.
Systems engineering.
Engineering.
Circuits and Systems.
Electronics and Microelectronics, Instrumentation.
TK7888.4
621.3815
Data Mining and Diagnosing IC Fails [electronic resource] / by Leendert M. Huisman. - Boston, MA : Springer US, 2005. - digital. - Frontiers in Electronic Testing, 31 0929-1296 ; . - Frontiers in Electronic Testing, 31 .
9780387263519
10.1007/b137446 doi
Engineering.
Electronics.
Systems engineering.
Engineering.
Circuits and Systems.
Electronics and Microelectronics, Instrumentation.
TK7888.4
621.3815