Breitenstein, Otwin.
Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials / [electronic resource] : by Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp. - X, 258 p. online resource. - Springer Series in Advanced Microelectronics, 10 1437-0387 ; . - Springer Series in Advanced Microelectronics, 10 .
Introduction -- Physical and Technical Basics -- Timing Strategies -- Heat Dissipation Mechanisms in Solar Cells -- Carrier Density Imaging -- Illuminated Lock-in Thermography (ILIT) -- Experimental Technique -- Theory -- Measurement Strategies -- Typical Applications -- Summary and Outlook.
This book deals with lock-in thermography (LIT) as a special active dynamic variant of the well-known IR thermography. It enables a much improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. The book concentrates on applications to electronic devices and materials, but the basic chapters are useful as well for non-destructive evaluation. Various experimental approaches to LIT are reviewed with special emphasis to different available commercial LIT systems. New LIT applications are reviewed, like Illuminated LIT applied to solar cells , and non-thermal LIT lifetime mapping. Typical LIT investigation case studies are introduced.
9783642024177
10.1007/978-3-642-02417-7 doi
Physics.
Engineering.
Materials.
Surfaces (Physics).
Physics.
Optics, Optoelectronics, Plasmonics and Optical Devices.
Characterization and Evaluation of Materials.
Engineering, general.
Structural Materials.
QC350-467 TA1501-1820 QC392-449.5 TA1750-1750.22
621.36
Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials / [electronic resource] : by Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp. - X, 258 p. online resource. - Springer Series in Advanced Microelectronics, 10 1437-0387 ; . - Springer Series in Advanced Microelectronics, 10 .
Introduction -- Physical and Technical Basics -- Timing Strategies -- Heat Dissipation Mechanisms in Solar Cells -- Carrier Density Imaging -- Illuminated Lock-in Thermography (ILIT) -- Experimental Technique -- Theory -- Measurement Strategies -- Typical Applications -- Summary and Outlook.
This book deals with lock-in thermography (LIT) as a special active dynamic variant of the well-known IR thermography. It enables a much improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. The book concentrates on applications to electronic devices and materials, but the basic chapters are useful as well for non-destructive evaluation. Various experimental approaches to LIT are reviewed with special emphasis to different available commercial LIT systems. New LIT applications are reviewed, like Illuminated LIT applied to solar cells , and non-thermal LIT lifetime mapping. Typical LIT investigation case studies are introduced.
9783642024177
10.1007/978-3-642-02417-7 doi
Physics.
Engineering.
Materials.
Surfaces (Physics).
Physics.
Optics, Optoelectronics, Plasmonics and Optical Devices.
Characterization and Evaluation of Materials.
Engineering, general.
Structural Materials.
QC350-467 TA1501-1820 QC392-449.5 TA1750-1750.22
621.36